Thin films of bulk heterojunction blend Ni-Phthalocyanine
Tetrasulfonic acid tetrasodium salt and dpoly
(3, 4-ethylenedioxythiophene) poly (styrenesulfonate) (NiPcTs:
PEDOT: PSS) with different (PEDOT:PSS) concentrations (0.5, 1, 2)
are prepared using spin coating technique with thickness 100 nm on
glass and Si substrate. The X-Ray diffraction pattern of NiPcTs
powder was studied and compared with NiPc powder, the pattern
showed that the structure is a polycrystalline with monoclinic phase.
XRD analysis of as-deposited (NiPcTs/PEDOT:PSS) thin films
blends in dicated that the film appeared at(100), (102) in
concentrations (0.5, 1) and (100) in concentration (2). The grain size
is increased with increasing (PEDOT:PSS) concentrations. FTIR
measurements for these bulk heterojunction blend thin films also
carried out in this work and gave good information about the bonds
and their locations. Sensor measurements of Si/NiPcTS:PEDOT:PSS
bulk heterojunctions blend thin films show a good sensitivity for NO2
gas Compared to NH3gas. The NiPcTS/PEDOT:PSS gas sensor
device work at room temperature than high temperature for NO2 gas
but good sensitivity at100ºC for NH3 gas and sensor work more
effectively in 0.5 concentration for both gases.
